发明名称 |
Segmented charge limiting test algorithm for electrical components |
摘要 |
A method of electrically testing an electrical component containing a plurality of networks with at least one node. The method uses segmented, charge limiting testing to charge the nodes and detect shorted or disconnected nodes while preventing accumulated charges in the networks from making uncharged nodes appear charged. The method is well suited for voltage contrast electron beam testing of unpopulated high density multichip modules and interconnect substrates.
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申请公布号 |
US5192913(A) |
申请公布日期 |
1993.03.09 |
申请号 |
US19920851716 |
申请日期 |
1992.03.16 |
申请人 |
MICROELECTRONICS AND COMPUTER TECHNOLOGY CORPORATION |
发明人 |
GORUGANTHU, RAMA R.;MYERS, THOMAS K.;ROSS, ANDREW W. |
分类号 |
G01R31/02;G01R31/28;G01R31/305 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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