| 摘要 |
<p>PURPOSE:To provide the semiconductor integrated circuit which makes time required to measure the current ability of an output buffer part shorter than before. CONSTITUTION:A test circuit 2 is provided between a control circuit 18 and transistors(TR) 29-32 which constitute the output buffer part. When 'H' is supplied to a test terminal 1, a control signal C4 is supplied to the TRs 29-32. When this control signal C4 is 'H', the Nch TRs 31 and 32 turn on and the sum of currents flowing to the two TRs can be detected. When the control signal C4 is 'L', on the other hand, the Pch TRs 29 and 30 turn on and the sum of currents flowing to the two TRs can be detected.</p> |
