发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To reduce an effect due to variations of a process by keeping the pull-down effect of a bit line unchanged by constructing a transistor by connecting in series memory transistors. CONSTITUTION:n Channel bypassing transistors 31 to 34 are constructed in the same structure as that of a memory transistor using a minimum design rule, and those transistors are disposed in series to ensure a predetermined transistor size. This structure is accordingly such that the c channel current bypassing transistors 31-34 and the transistor using a minimum design rule, are changed, interlocked upon the variations of a process. Thus, since performance of the transistor for supplying a potential to bit lines BL1-BL4 is varied as in the n channel current bypassing transistors 31-34, the pull-down effect of the bit lines is kept unchanged. Thus, stable operation is ensured without being affected by process variations.
申请公布号 JPH0555515(A) 申请公布日期 1993.03.05
申请号 JP19910212095 申请日期 1991.08.23
申请人 SEIKO EPSON CORP 发明人 KASAI HIROYUKI
分类号 H01L27/10;H01L21/8242;H01L27/108 主分类号 H01L27/10
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