发明名称 DETECTION OF INCLINATION OF OBJECT TO BE INSPECTED, PROJECTION ALIGNER AND DETECTION OF CYCLE OF PERIODICALLY CHANGING SIGNAL
摘要 PURPOSE:To measure a basic frequency accurately without generating a discrepancy for determining the inclination of an object to be inspected accurately by using an approximate method wherein a very high approximate accuracy can be obtained when the basic frequency comes near a frequency at a halfway point between two adjacent sampling points. CONSTITUTION:An interference fringe generated by laser reflection light 26'' from an object to be inspected 4 and reference light 27'' is detected on a CCD detector 3 and the detected signal is fast-Fourier-transformed. Based on the data about a spectrum position (DELTA') which gives an interpolated spectrum peak determined by the data about a sampling.point to give the maximum value of a part to correspond to a fringe cycle of the spectrum of the fast-Fourier-transformed signal and a larger point next to the sampling point and the data about a spectrum position (DELTA'') which gives an interpolated spectrum peak determined by the data about the maximum value and two adjacent values, a spectrum position (DELTA) is determined by a weighted mean method. By this method, a cycle or pitch of a periodically changing signal is detected accurately and thereby the inclination of the object to be inspected can be determined accurately.
申请公布号 JPH0555115(A) 申请公布日期 1993.03.05
申请号 JP19910218259 申请日期 1991.08.29
申请人 HITACHI LTD 发明人 OSHIDA YOSHITADA;NINOMIYA HIROSHI;KUROSAKI TOSHISHIGE
分类号 B23K26/02;B23K26/03;G03F7/20;G03F9/00;H01L21/027;H01L21/30;H01S3/00 主分类号 B23K26/02
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