发明名称 SOI semiconductor device with a wiring electrode contacts a buried conductor and an impurity region
摘要 PCT No. PCT/JP90/01124 Sec. 371 Date Apr. 24, 1991 Sec. 102(e) Date Apr. 24, 1991 PCT Filed Sep. 4, 1990.According to this invention, an SOI semiconductor device having a thin semiconductor film (15) formed on an insulating film (12) includes a semiconductor substrate (11), the insulating film (12) having a recess portion (13a, 13b) and formed on the semiconductor substrate (11), and a conductor (14a, 14b) buried in the recess portion (13a, 13b). In addition, the SOI semiconductor device further includes the semiconductor film (15) formed on the insulating film (12), and an impurity region (16) formed in the semiconductor film (15) and electrically connected to the conductor (14a, 14b).
申请公布号 US5191397(A) 申请公布日期 1993.03.02
申请号 US19910684932 申请日期 1991.04.24
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 YOSHIDA, TOHRU
分类号 H01L21/74;H01L29/786 主分类号 H01L21/74
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