发明名称 |
Compact atomic force microscope |
摘要 |
This is an atomic force microscope in which the sensor can be built as a very small integrated structure. The sensor utilizes optical interference and can be operated in either the contact mode for high resolution or in the non-contact mode to measure electric and magnetic fields. One configuration of this microscope is a stand-alone configuration in which the microscope can be placed on or be suspended above large samples for scanning of small local areas thereof. The sensor is built into a scanner so that the sensor can be scanned over a stationary sample.
|
申请公布号 |
US5189906(A) |
申请公布日期 |
1993.03.02 |
申请号 |
US19910687684 |
申请日期 |
1991.04.19 |
申请人 |
DIGITAL INSTRUMENTS, INC. |
发明人 |
ELINGS, VIRGIL B.;GURLEY, JOHN A.;SARID, DROR |
分类号 |
G01B21/30;G01Q20/02;G01Q60/24;G01Q70/02 |
主分类号 |
G01B21/30 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|