Unitized test system with bi-directional transport feature

摘要

An improved system for testing electrical circuit boards in an environmental test chamber includes a carrier moveable into and out of the chamber. The carrier supports a relatively large number of printed circuit boards to be tested by exposure to extremes of temperature, for example. Each board is electrically linked to a carrier-mounted multiple-conductor "gang" connector. The chamber has a multiple-conductor gang receptacle into which the connector is plugged as the carrier moves fully into the chamber. Such arrangement provides a way to electrically monitor board testing by instruments outside the chamber. An automated insertion/extraction assembly powers the carrier between an interconnect position and a disconnect position. The circuit boards are handled as a group of "unit" and the assembly provides both automatic connection and disconnection upon initiation by the chamber operator. Circuit board testing may thereby be accomplished accurately and more expeditiously than with earlier systems.