发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF |
摘要 |
PURPOSE: To inhibit undesired silicon deposition on the interface of a metalized layer containing aluminum and silicon and single-crystal silicon. CONSTITUTION: In a semiconductor device formed by having a main body 1 of single-crystal semiconductor provided with a dielectric layer 2 having a contact hole 3 and by contacting a metalized layer 4 containing aluminum and silicon through the contact hole to the main body of semiconductor, in order to inhibit undesired silicon deposition, a discontinuous nucleus layer 5 of a metal nobler than silicon is formed on the main body 1 of silicon inside the contact hole 3, before the formation of the metalized layer 4. |
申请公布号 |
JPH0547699(A) |
申请公布日期 |
1993.02.26 |
申请号 |
JP19920002893 |
申请日期 |
1992.01.10 |
申请人 |
PHILIPS GLOEILAMPENFAB:NV |
发明人 |
ROBERUTASU ADORIANUSU MARIA UORUTAASU;EDOUIN TEIEBU SUWARUTO;ANDOREASU MARINUSU TEODORASU FUAN DERU PUTSUTEN |
分类号 |
H01L21/28;H01L21/285;H01L21/288;H01L21/768;H01L23/532 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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