Test data (5) are inserted on the data source side into a flow of data (4) transmitted to a data receiver (3) from a data source (1) via at least one transmission path (2). A bit error function e(n) is obtained from the test data received (6) which is multiplied by an analysis function for partwise evaluation and then time-integrated. The result of evaluation is a measure of the number of bit errors. The bit error function (e(n)) is preferably auto-correlated by being used itself as an analysis function. The value of the main maximum M of the auto-correlation function AKF(m) is a measure of the number of bit errors.
申请公布号
DE4121480(C1)
申请公布日期
1993.02.25
申请号
DE19914121480
申请日期
1991.06.26
申请人
SIEMENS AG, 8000 MUENCHEN, DE
发明人
ARWEILER, HANS WERNER, DIPL.-ING.;WOLF, ANDREAS, DR.-ING., 1000 BERLIN, DE
