VORRICHTUNG ZUM AUTOMATISCHEN TESTEN EINES BEANSPRUCHUNGSBETRIEBES EINER HALBLEITERSPEICHERVORRICHTUNG

摘要

In a highly integrated semiconductor memory device, apparatus for setting a stress mode without applying a stress voltage from the exterior is provided. A triggered time point TS to a stress mode can be set by greatly raising an internal supply voltage when the external supply voltage is raised to a voltage over the stress voltage.