发明名称 Measuring thickness of layer of water, snow or ice - evaluating reflected EM radiation directed at inclined angle from above surface e.g. road
摘要 A method of measuring the thickness of a film of water, snow or ice on a surface involves directing pulsed l.m. radiation obliquely from above onto the surface and measuring and evaluating the reflected radiation. The transition time difference is measured between pulsed signals reflected at the surface of the covering film and at the covered surface. The film thickness is derived from this time difference. Time resolved signal reception is performed to enable the time difference to be determined from the time variation of the received signal.
申请公布号 DE4141446(C1) 申请公布日期 1993.02.25
申请号 DE19914141446 申请日期 1991.12.16
申请人 ANT NACHRICHTENTECHNIK GMBH, 7150 BACKNANG, DE 发明人 BUEHNER, MARTIN, DIPL.-ING. (FH), 7160 GAILDORF, DE;WOLF, WILLI, DIPL.-PHYS., 7150 BACKNANG, DE;BOHNERT, WERNER, DIPL.-ING., 7000 STUTTGART, DE;KERN, WOLFGANG, DIPL.-ING., 7127 PLEIDELSHEIM, DE;SCHAEFER, HENNING, 7142 MARBACH, DE;BARTH, DIETER, 7155 OPPENWEILER, DE;FEILHAUER, HELMUT, DIPL.-ING., 7068 URBACH, DE
分类号 G01B15/02;G01S13/10;G01S17/10;G08B19/02 主分类号 G01B15/02
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