发明名称 SURFACE ANALYZING APPARATUS
摘要 PURPOSE:To obtain an apparatus which can capture the characteristic X rays from the surface of an excited sample and can analyze the component of the surface of the sample and wherein an energy dispersion type X-ray detector for capturing the characteristic X rays can be readily attached and removed. CONSTITUTION:An energy source for emitting energy particles into a sample 1 and an energy dispersion type X-ray detector 18 are attached to a vacuum container 20 for containing a sample 1. A connecting chamber 79 which is freely evaluated into the vacuum state is independently formed for the vacuum container 20. The energy dispersion type X-ray detector 28 is attached to the connecting chamber 79 so that the detector can be freely attached and removed. The characteristic X rays emitted from the surface of the excited sample 1 are captured at the total reflection angle. Thus, the component of the thin film of the surface of the sample 1 can be analyzed. When, the energy dispersion type X-ray detector 28 is removed from the connecting chamber 79, the detector can be removed without breaking the vacuum state of the vacuum container 20.
申请公布号 JPH0545308(A) 申请公布日期 1993.02.23
申请号 JP19910228724 申请日期 1991.08.14
申请人 KOKUSAI CHODENDO SANGYO GIJUTSU KENKYU CENTER;FUJIKURA LTD;SHOWA ELECTRIC WIRE & CABLE CO LTD;ASAHI GLASS CO LTD 发明人 USUI TOSHIO;AOKI YUJI;KAMEI MASAYUKI;MORISHITA TADATAKA
分类号 G01N23/225;G01N23/223 主分类号 G01N23/225
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