TESTING METHOD OF SEMICONDUCTOR DEVICE,申请号JP19900414974-传众专利搜索

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发明名称	TESTING METHOD OF SEMICONDUCTOR DEVICE
摘要
申请公布号	JPH0545409(A)	申请公布日期	1993.02.23
申请号	JP19900414974	申请日期	1990.12.27
申请人	NIPPON INTER ELECTRONICS CORP	发明人	CHOKAI TAKEO
分类号	G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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