发明名称 |
Method of locating a fault in a logic IC device |
摘要 |
A fault in a logic IC device including a plurality of logic cells is diagnosed by the use of an intentional fault. The intentional fault is introduced into a portion of logical operation data for the logic cells of the device to produce a faulty logical operation data. That portion of the logical operation data corresponds to a fault candidate which represents a location in the device at which hazard is supposed to have occurred to make it uncertain whether or not a fault exists at the location. |
申请公布号 |
US5189365(A) |
申请公布日期 |
1993.02.23 |
申请号 |
US19910772412 |
申请日期 |
1991.10.07 |
申请人 |
HITACHI, LTD. |
发明人 |
IKEDA, MASAHARU;FUNABIKI, TAKAHIRO;KASUGA, KAZUO |
分类号 |
G01R31/317;G06F11/22;G06F11/26;G06F17/50;H01L21/66 |
主分类号 |
G01R31/317 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|