发明名称 METHOD FOR PRODUCING A SEMICONDUCTOR DEVICE
摘要 A method for producing a field effect transistor includes depositing an insulating film on an active layer produced in a semiconductor substrate and removing a part of the insulating film, leaving a side wall substantially perpendicular to the substrate. A refractory metal is deposited on the surface of the semiconductor substrate and the insulating film. The refractory metal is removed except for a portion at the side wall of the insulating film to produce a gate electrode. A high dopant concentration region is ion implanted using the insulating film and refractory metal as a mask. The insulating film is removed and an intermediate dopant concentration region is ion implanted using the refractory metal as a mask. A source electrode is produced on the high dopant cocentration region and a drain electrode is produced on the intermediate dopant concentration region. The invention may be used to produce asymmetrically doped drain and gate regions and an asymmetrically disposed gate electrode.
申请公布号 US5187112(A) 申请公布日期 1993.02.16
申请号 US19900504837 申请日期 1990.04.05
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KOHNO, YASUTAKA;OKU, TOMOKI
分类号 H01L29/812;H01L21/033;H01L21/285;H01L21/338;H01L29/08;H01L29/417;H01L29/423 主分类号 H01L29/812
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