发明名称 |
PATTERNING METHOD OF POLY-SILICONE |
摘要 |
The method for forming a polysilicon pattern comprises (a) forming an oxide film (2) and a polysilicon layer (3) on the semiconductor substrate (1) and impregnating an impurity into the layer (3), (b) lifting-off a glaze and a natural oxide film (4) by the first etching process, (c) forming a photoresist pattern (5') using a mask pattern (6), (d) lifting-off a residue (4') and a particle with HF or NH4F soln. by the second etching process, and (e) dry-etching the layer (3) to form a polysilicon pattern (3').
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申请公布号 |
KR930000912(B1) |
申请公布日期 |
1993.02.11 |
申请号 |
KR19900005007 |
申请日期 |
1990.04.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, KYONG - TAE;LEE, CHONG - HAENG;SUNG, BYONG - HAK |
分类号 |
H01L21/302;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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