发明名称 PATTERNING METHOD OF POLY-SILICONE
摘要 The method for forming a polysilicon pattern comprises (a) forming an oxide film (2) and a polysilicon layer (3) on the semiconductor substrate (1) and impregnating an impurity into the layer (3), (b) lifting-off a glaze and a natural oxide film (4) by the first etching process, (c) forming a photoresist pattern (5') using a mask pattern (6), (d) lifting-off a residue (4') and a particle with HF or NH4F soln. by the second etching process, and (e) dry-etching the layer (3) to form a polysilicon pattern (3').
申请公布号 KR930000912(B1) 申请公布日期 1993.02.11
申请号 KR19900005007 申请日期 1990.04.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, KYONG - TAE;LEE, CHONG - HAENG;SUNG, BYONG - HAK
分类号 H01L21/302;(IPC1-7):H01L21/302 主分类号 H01L21/302
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