| 摘要 |
PURPOSE:To offer a data producing device which enables easy production of testing data. CONSTITUTION:In a data producing device for testing, which judges existence of malfunction for a semi-conductor integrated circuit, a plurality of flip-flops in an input logic information is made to be flip-flops for scanning, and, the first data processing means 2 which adds leads connection information among each flip-flop for scanning, and between outernal pins and the flipflops for scanning, to the said logic information, and a functional block having predetermined logic, are made to be a functional block having pins for exclusive use of testing, and finally the second data processing means 3 which adds leads connection information between the exclusive testing pins and the external pins, and logic information for controlling directly the said functional block form the external pins, to the said logic information, is provided. Moreover, a logic information storage means 5 which stores the logic information processed by the first and second data processing means 2 and 3, and also an automatic data producing means 4 which automatically produces testing data based upon the store logic information, are provided, too. |
