发明名称 Data latch circuit having non-volatile memory cell.
摘要 <p>A data latch circuit comprises a non-volatile memory cell (11) having its threshold voltage changed in accordance with data to be stored therein, and a latch circuit (60). The cell (11) has a transistor (T3) for writing data and a transistor (T4) for reading data. The writing and reading transistors (T3, T4) has a common floating gate. The reading transistor (T4) has a threshold voltage lower than the writing transistor (T3). During normal operation, a ground potential (Vss) is applied to the control gate of the reading transistor (T4). The latch circuit (60) latches data in accordance with whether the non-volatile memory cell (11) is in the on-state or off-state. <IMAGE></p>
申请公布号 EP0525680(A2) 申请公布日期 1993.02.03
申请号 EP19920112729 申请日期 1992.07.24
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 ATSUMI, SHIGERU;BANBA, HIRONORI
分类号 G11C17/00;G06F11/00;G11C8/06;G11C16/04;G11C16/06;G11C29/00;G11C29/04;(IPC1-7):G11C11/417 主分类号 G11C17/00
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