SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE WITH TESTING-CONTROLLING CIRCUIT PROVIDED IN INPUT/OUTPUT REGION,申请号EP19910916606-传众专利搜索

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发明名称	SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE WITH TESTING-CONTROLLING CIRCUIT PROVIDED IN INPUT/OUTPUT REGION
摘要
申请公布号	EP0502210(A4)	申请公布日期	1993.02.03
申请号	EP19910916606	申请日期	1991.09.19
申请人	FUJITSU LIMITED	发明人	YAMAMURA, TAKESHI
分类号	G01R31/3185;(IPC1-7):G01R31/28;H01L27/04	主分类号	G01R31/3185
代理机构		代理人
主权项
地址

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