| 摘要 |
Apparatus for holding and positioning samples of material in a spectrometer includes a sample holding table, a first rotatable platform, and a second rotatable platform. An input optical train mounted on the first platform directs the beam from the spectrometer to the sample. An output optical train mounted to the second platform directs the beam from the sample to a detector. When the first and second platforms are parallel to each other, the input optical train directs the spectrometer beam directly to the output optical train, so that a transmission spectrum may be taken. When the platforms are not parallel to each other, the input optical train directs the spectrometer beam downwardly, and it is only upon reflection from the sample that the beam is directed to the output optical train, so that a reflectance spectrum may be taken.
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