DEFECT SECTION INSPECTING METHOD FOR COLOR FILTER

摘要

PURPOSE:To detect a white defect section and color nonuniformity in the color pattern forming process of the first color. CONSTITUTION:After color patterns 3 of the first color are formed on a transparent board 1, color patterns 9 of another color are arranged adjacently to the color patterns 3, and a white defect section 6 generated on the color patterns 3 of the first color is visually detected. After color patterns of a specific color are formed on the transparent board, a mask shielding the portion other than the color patterns is arranged, and the color nonuniformity existing on the color patterns of the specific color is visually detected.