发明名称 |
Copper/epoxy structures |
摘要 |
A high density, high performance circuit fabricated with a copper/epoxy structure. The circuit is well suited for an integrated circuit interconnect device. Fluorene-containing epoxy resins may be used to obtain certain material and processing advantages over copper/polyimide structures. The circuit structure resides on a substrate which may be ceramic, a semiconductor such as silicon, or, advantageously, a cured epoxy resin.
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申请公布号 |
US5183972(A) |
申请公布日期 |
1993.02.02 |
申请号 |
US19910650137 |
申请日期 |
1991.02.04 |
申请人 |
MICROELECTRONICS AND COMPUTER TECHNOLOGY CORPORATION;MINNESOTA MINING AND MANUFACTURING COMPANY |
发明人 |
DUANE, DIANA C.;ZILLEY, ERIC L.;JORDAN, ROBERT C. |
分类号 |
H01L23/14;H01L23/498;H01L23/538;H05K3/10;H05K3/20;H05K3/24;H05K3/38;H05K3/46 |
主分类号 |
H01L23/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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