发明名称 ULTRASONIC DEFECTOSCOPE
摘要 An ultrasonic defect detector including a microprocessor controller co-operating with a metering circuit, characterised in that the microprocessor controller (SM) is connected with a metering circuit (UP) connected with the defect detector's transmit/ receive circuits: test circuit (UD1) and check circuit (UD2), and the microprocessor controller is also connected with the defect detector's regulating units (ND1, ND2) connected with the defect detector's transmit/receive circuits: test circuit (UD1) and check circuit (UD2).<IMAGE>
申请公布号 PL159722(B1) 申请公布日期 1993.01.29
申请号 PL19880270501 申请日期 1988.02.04
申请人 发明人
分类号 G01N;G01N29/04;G05B19/00;(IPC1-7):G01N29/04 主分类号 G01N
代理机构 代理人
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