发明名称 METHOD FOR DETECTING DEFECT OF RETICLE PATTERN
摘要 PURPOSE:To detect translucent pattern defects of a reticle such as water spots and fur. CONSTITUTION:The pattern images of a reticle 3 are successively projected on a photosensitive resist film 2 by exposure by a step and repeat system while varying exposure energy every shot within the range of 230-260mj/cm<2> and development is carried out. The resulting patterns are compared to each other and pattern defects of the reticle 3 are detected.
申请公布号 JPH0519449(A) 申请公布日期 1993.01.29
申请号 JP19910168463 申请日期 1991.07.09
申请人 TOSHIBA CORP 发明人 AONO MITSUHIRO
分类号 G03F1/84;H01L21/027;H01L21/30;H01L21/66 主分类号 G03F1/84
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