发明名称 CHARGE CURRENT BEAM DEVICE
摘要 PURPOSE:To remove a contaminant without disassembling a device and changing the vacuum state by supplying heating current to a coil-shaped body which is formed by enclosing a charge current beam channel. CONSTITUTION:When the outside frame (for example, lens yoke) of a coil-shaped heating element 6 is polluted and charge is charged, the electric field is shielded by the coil-shaped heating element 6. Consequently, it does not expand to an electron beam channel and has no effect on the electron beam. On the other hand, when part of the coil-shaped heating element 6 is polluted, the accumulated contaminant is evaporated and removed by switching a switch 7 into (a), connecting the coil- shaped heating element 6 to a power supply 8, and heating the coil-shaped heating element 6 at 1,500 deg.C or more.
申请公布号 JPS5657242(A) 申请公布日期 1981.05.19
申请号 JP19790133416 申请日期 1979.10.16
申请人 NIPPON ELECTRON OPTICS LAB 发明人 GOTOU NOBUO;TANAKA KAZUMITSU
分类号 H01J37/20;H01J37/02;H01J37/18;H01L21/027 主分类号 H01J37/20
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