发明名称 Measuring method for beam spot luminescence distribution.
摘要 <p>The invention relates to a measuring method and a measuring device to measure luminescence distribution within a beam spot of the electron beam irradiated on a tube surface of a color cathode ray tube. The measuring region is fixed within the specific fluorescent substance of the tube surface. The irradiated locations of the electron beam are changed variously, satisfying the condition that the beam spot contains the measurement region. The luminescent brightness of the measurement region is measured regarding each irradiated location of the electron beam. Furthermore, the luminescence distribution of the beam spot is determined based on each luminescent brightness. &lt;IMAGE&gt;</p>
申请公布号 EP0524374(A1) 申请公布日期 1993.01.27
申请号 EP19920106263 申请日期 1992.04.10
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 EMMOTO, KAZUO
分类号 H01J9/42;H04N17/04 主分类号 H01J9/42
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