发明名称 System for inspecting electrically conductive pattern.
摘要 <p>Electrically conductive patterns such as antenna patterns (P) on window glass (Q) are inspected for a wire break or short circuit. The impedances between an electrically conductive pattern (P) and an electrically conductive layer (Q) on an inspective table (3) are measured at predetermined frequencies, or the levels of signals reflected from the electrically conductive pattern are measured at predetermined frequencies. A decision unit (5) determines whether the electrically conductive pattern is acceptable or not based on the frequency characteristics of the electrically conductive pattern and the reference frequency characteristics of a reference electrically conductive pattern. &lt;IMAGE&gt;</p>
申请公布号 EP0524837(A1) 申请公布日期 1993.01.27
申请号 EP19920306812 申请日期 1992.07.24
申请人 NIPPON SHEET GLASS CO., LTD. 发明人 MURAKAMI, HARUNORI;OHARA, SHOHEI
分类号 G01R31/00;G01R31/02;G01R31/304 主分类号 G01R31/00
代理机构 代理人
主权项
地址