发明名称 Method of making dynamic random access memory cell having a SDHT structure
摘要 A SDHT structured DRAM Cell with a P type silicon substrate and a P well region with a first trench formed into the P well region and a CVD oxide film layer formed on the wall of the first trench is disclosed. A second trench is formed in the bottom of the first trench. A capacitive oxide film layer is formed on the CVD oxide film layer of the first trench and on the second trench with a conducting material filling the trenches to form an inside charge storage electrode. A N MOSFET is formed on the P well region near the first trench with the N MOSFET having a soure N+ region and a drain N+ region, each including a LDD region.
申请公布号 US5182224(A) 申请公布日期 1993.01.26
申请号 US19910641621 申请日期 1991.01.16
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 KIM, JAE W.;CHUNG, IN S.
分类号 H01L21/334;H01L21/8242;H01L29/94 主分类号 H01L21/334
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