Method of aligning an X-ray diffraction goniometer and apparatus therefor,申请号US19540404518-传众专利搜索

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发明名称	Method of aligning an X-ray diffraction goniometer and apparatus therefor
摘要
申请公布号	US2709752(A)	申请公布日期	1955.05.31
申请号	US19540404518	申请日期	1954.01.18
申请人	NORTH AMERICAN PHILIPS COMPANY, INC.	发明人	PARRISH WILLIAM;LOWITZSCH KURT;HAMACHER EDWARD A.
分类号	G01N23/20;G01N23/207	主分类号	G01N23/20
代理机构		代理人
主权项
地址

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