| 摘要 |
PURPOSE:To improve the productivity and reliability of a semiconductor device by generating an internal level potential which is different from a power supply potential and reference potential from the outside and reducing the leak current testing time of a signal transmitting system for supplying internal level potential signals. CONSTITUTION:A backup function control circuit 7 for controlling the oscillation of a ring oscillator 2 from outside which supplies electric charges to a signal transmitting system for transmitting internal level potential signals phi3. Leak current testing is performed by stopping the oscillation of the oscillator 2 by means of the control circuit 7. |
