发明名称 Capacitive level measurement probe, esp. for ballast contg. graphite or liquid metal - has AC measurement bridge connected between conducting surface inside insulated tube and conducting measurement medium
摘要 The probe has an electrically insulating surface facing the medium, especially a tube with an inner electrically conducting surface, especically in the form of another tube. The a.c. measurements bridge is connected on one side to the inner conducting surface and on the other side to the external measurement medium. The real and imaginary parts of the measurement current between the inner conducting surface and eternal medium are detected separately. ADVANTAGE - Measurements cannot be adversely affected by deposits of thin, electrically conducting films on probe.
申请公布号 DE4124054(A1) 申请公布日期 1993.01.21
申请号 DE19914124054 申请日期 1991.07.19
申请人 SIEMENS AG, 8000 MUENCHEN, DE 发明人 DILCHER, LOTHAR, DIPL.-ING., 5060 BERGISCH GLADBACH, DE
分类号 F27D21/00;G01F23/26 主分类号 F27D21/00
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