发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURE THEREOF |
摘要 |
PURPOSE:To provide a semiconductor memory device which is provided with no sharp angle at the end of a memory node and inhibits the generation of insulation breakdown and its manufacturing method. CONSTITUTION:A semiconductor memory device is a semiconductor memory device provided with a plurality of memory cells which include an accumulation capacity formed on a semiconductor board 1. The accumulation capacity comprises a memory node 10 whose edge angle is round, a capacity insulation film 11 formed on the memory node 10 and a plate electrode 12 formed on the capacity insulation film 11. |
申请公布号 |
JPH056975(A) |
申请公布日期 |
1993.01.14 |
申请号 |
JP19910245549 |
申请日期 |
1991.09.25 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KUDO CHIAKI;UNO AKIHITO;NISHIO MIKIO |
分类号 |
H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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