发明名称 SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To provide a semiconductor memory device which is provided with no sharp angle at the end of a memory node and inhibits the generation of insulation breakdown and its manufacturing method. CONSTITUTION:A semiconductor memory device is a semiconductor memory device provided with a plurality of memory cells which include an accumulation capacity formed on a semiconductor board 1. The accumulation capacity comprises a memory node 10 whose edge angle is round, a capacity insulation film 11 formed on the memory node 10 and a plate electrode 12 formed on the capacity insulation film 11.
申请公布号 JPH056975(A) 申请公布日期 1993.01.14
申请号 JP19910245549 申请日期 1991.09.25
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KUDO CHIAKI;UNO AKIHITO;NISHIO MIKIO
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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