发明名称 METHOD FOR CHECKING ACTIVE MATRIX SUBSTRATE
摘要 <p>PURPOSE:To easily and surely check a defect by providing a signal line for check connected to the other end of a data signal line and checking a data signal line driving circuit and the data signal line based on the output from a video signal line. CONSTITUTION:Two signal lines 4 for data check to which data signal lines X are alternately connected are formed on the terminal side of data signal lines X from a data signal line driving circuit 2 to a picture element part 1, and data check signal input terminals S are provided in their end parts. Two signal lines 5 for scanning check to which scanning signal lines Y are alternately connected are formed on the terminal side of scanning signal lines Y from a scanning signal line driving circuit 3 to the picture element part 1, and scanning check signal output terminals G are provided in their end parts. In this case, check is performed through signal lines 4 for data check and signal lines 5 for scanning check in the terminals of data signal lines X and scanning signal lines Y, and these signal lines 4 and 5 are removed after the end of check.</p>
申请公布号 JPH055897(A) 申请公布日期 1993.01.14
申请号 JP19910159163 申请日期 1991.06.28
申请人 SHARP CORP 发明人 YAMASHITA TOSHIHIRO;MATSUSHIMA YASUHIRO;SHIMADA NAOYUKI;TAKATO YUTAKA
分类号 G02F1/133;G02F1/13;G02F1/1343;G02F1/136;G02F1/1368;G06F11/267;G09F9/30;G09G3/36 主分类号 G02F1/133
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