发明名称 Simultaneous multibeam scanning system
摘要 A dual, simultaneous beam scanning system for simultaneously scanning two individually modulated adjacent scan lines on an internal drum imaging surface uses a deflector which varies the angular orientation between combined orthogonally polarized beams so that one of the beams rotates about the other in synchronism with the angular position (the distance between start of scan) along the scan lines around the drum imaging surface. Signals from both a beam position sensing photodetector array and from a shaft encoder on the deflector unit, such as a Hologon deflector, controls the deflection of one of the orthogonally polarized beams so as to maintain the spacing and prevent crossovers of the adjacent scan lines and also reduce differential bow. Differential bow may be corrected both in the internal drum configuration and in a flat field imaging system using plural beam scanning. The scan lines can overlap so as to provide high resolution imaging at a rate of the order of hundreds of scan lines per second.
申请公布号 US5179463(A) 申请公布日期 1993.01.12
申请号 US19910802111 申请日期 1991.12.04
申请人 HOLOTEK LTD. 发明人 KRAMER, CHARLES J.
分类号 G02B26/10;G02B27/28;H04N1/047;H04N1/06;H04N1/191 主分类号 G02B26/10
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