发明名称 METHOD AND DEVICE FOR ABSOLUTE INSPECTION OF SURFACE BY INTERFEROMETER
摘要 PURPOSE: To enable a precise absolute measurement of a plane by using the plane a flatness of which is to be inspected as an interferometer mirror, and storing wave front interferences of the plane. CONSTITUTION: A laser L generates parallel light beams. A width of the beams is enlarged by a telescope T. The beams are guided to a measurement beam path M and a reference beam path RF by a beam splitter S. A first, a second interferometer mirrors I, H return the reference beam path RF and measurement beam path M to original directions. The returned paths are guided to a camera sensor K by the splitter S. The sensor K detects a three-dimensionally resolved interference image of reference beams by the measurement beams, namely, an interferogram. The mirror I in the beam path RF is turned a slight angleεfrom a vertical direction. Since an actual plane always has a heightwise deviation, three-dimensional wave front interferences are unavoidable which, however, are calculated by a calculator R according to a three-column algorithm.
申请公布号 JPH051909(A) 申请公布日期 1993.01.08
申请号 JP19910012190 申请日期 1991.02.01
申请人 CARL ZEISS:FA 发明人 MIHIYAERU KIYUUHIERU
分类号 G01B9/02;G01B11/30 主分类号 G01B9/02
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