发明名称 Test appts. using continuous movement device for probing PCB - determines electrical characteristics of node located on surface of substrate e.g. printed circuit board
摘要 The permanent movement test system (30) uses a measurement control processor (32), which is connected to other components of the system. An input to the control processor comes from a data bank (34) of the p.c.b. components. This input supplies the node location on the p.c.b. to be tested. The locations are related to the p.c.b. x-y coordinate system. The system (30) has a three-axis movement system (36) and a movement control device (38). The movement system makes it possible for the probe to be positioned on or over the p.c.b. at each point. A position encoder enables the movement control to determine the direction, speed and relative position of each of the associated axes. Movement commands are issued from the control processor to the movement control device. ADVANTAGE - Enables a rapid testing of p.c.b.'s at small distance from structures to be tested.
申请公布号 DE4221075(A1) 申请公布日期 1993.01.07
申请号 DE19924221075 申请日期 1992.06.26
申请人 DIGITAL EQUIPMENT CORP., MAYNARD, MASS., US 发明人 MELLITZ, RICHARD I., PEPPERELL, MASS., US;DOWD, MICHAEL V., BOSTON, MASS., US
分类号 G01R31/02;G01R31/26;G01R31/28 主分类号 G01R31/02
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