Test pattern signal generator and inspection method of display device using the same.

摘要

In a test pattern signal generator, an infrared radiation generating section for generating a test pattern selecting infrared signal in response to a test pattern selecting signal given from a console box and a test pattern signal generating section for receiving the test pattern selecting infrared signal and for outputting a test pattern signal corresponding to the received signal are at least separated individually. In an inspection method of a display device, the test pattern signal generator is used, and a display device to be inspected and adjusted and a test pattern signal generating section are moved in a state that they are previously connected through a cable, and an infrared radiation generating section is installed at a prescribed position, and when the display device and the test pattern signal generating section to be moved enter a prescribed working area, a test pattern selecting signal is sent from a console box to the infrared radiation generating section. <IMAGE>