发明名称 Refractory metal thin film having a particular step coverage factor and ratio of surface roughness
摘要 In forming a metal or metal silicide film by CVD, a fluoro-silane is used as a reaction gas, or a fluoro-silane is added to a source gas. Examples of the metal halide used in the present invention include fluorides and chlorides of tungsten, molybdenum, titanium, tantalum and niobium. Among them, fluorides of tungsten and molybdenum are more desirable particularly from the viewpoint of the availability of the deposited metal or metal silicide. It is preferred that the source gases, i.e. silane series gas and metal halide, be diluted with a carrier gas such as nitrogen, hydrogen, helium or argon, and this is also true of the fluoro-silane. The total pressure is preferably 0.01 to 10 Torr. The reaction temperature is desirably 200 DEG to 800 DEG C., more desirably 300 DEG to 500 DEG C. Plasma CVD instead of thermal CVD may be employed for the purpose of lowering the reaction temperature.
申请公布号 US5177589(A) 申请公布日期 1993.01.05
申请号 US19910765310 申请日期 1991.09.25
申请人 HITACHI, LTD. 发明人 KOBAYASHI, NOBUYOSHI;GOTO, HIDEKAZU;SUZUKI, MASAYUKI;HOMMA, YOSHIO;YOKOYAMA, NATSUKI;NAKAMURA, YOSHITAKA
分类号 C23C16/14;C23C16/42;H01L21/285;H01L21/3205;H01L21/768 主分类号 C23C16/14
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