首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
OPTICAL THICKNESS MEASURING APPARATUS
摘要
申请公布号
JPH04369409(A)
申请公布日期
1992.12.22
申请号
JP19910115093
申请日期
1991.05.21
申请人
MITSUBISHI ELECTRIC CORP
发明人
HISAKUNI AKIRA
分类号
G01B11/06
主分类号
G01B11/06
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Exposure pattern forming method and exposure pattern
CMP slurry and method of manufacturing semiconductor device
Method of processing binary program files
Semiconductor device structures including protective layers formed from healable materials
System and method for providing warranties in electronic commerce
Piperidine compounds useful as PPAR activators
Method for determining an aspiration flow and time
Coaxial connector integrated connector for board connection
Method for analyzing substance
Intelligent apparatus, system and method for financial data computation and analysis
Shaped trilobal particles
Paint can light fixture
Nipple
Oral suction device holder cassette arm
Air conditioner
Bathroom basin
Dispensing container
Lipstick container
Container for lip gloss
Depilator
