Method for performing quality logic tests on data processing systems by sequentially loading test microinstruction programs and operating microinstruction programs into a single control store

摘要

A method for performing initial testing of a system wherein, in response to power on of the system, the control store of a central subsystem is loaded with a testing microinstruction program for internal testing of the central subsystem and the testing program executed. Upon completion of the testing program, the central subsystem operating programs are loaded into the control store, and control of the data processing system is transferred to the system programs.