| 摘要 |
PURPOSE:To make efficient the self-diagnostic function of an IC testing device. CONSTITUTION:Input signals are input from a CPU 5 to a measuring portion 8 via line A to line A1 and signals output from the measuring portion 8 are returned to the CPU 5 via the line A1 to the line A and ICs to be tested by the measuring portion 8 are judged as to whether they are conforming or nonconforming articles and the result of the judgement is output to an external automatic selecting device or the like by the route of line B to line B1. A predetermined time or a predetermined number of times of tests are preset by a setting circuit 6 and as the time elapses or each time a test is completed a switching signal is output from the setting circuit 6 and input to a switching circuit 2 and the line A is switched from the line A1 side to the line A2 side. Also at a judgement output circuit 4 the line B is switched from the line B1 side to the line B2 side in response to the switching signal. Under these conditions samples 7 to be checked are tested and the result of the judgement on the samples 7 is input to an alarm generating circuit 3 via line B to line B, and when the result of the judgement conforms with the conformity or nonconformity of the samples 7 to be checked the function of the testing device is judged to be normal. |
