ON CHIP SEMICONDUCTOR MEMORY ARBITRARY PATTERN,PARALLEL TEST APPARATUS AND METHOD,申请号GB19920023130-传众专利搜索

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发明名称	ON CHIP SEMICONDUCTOR MEMORY ARBITRARY PATTERN,PARALLEL TEST APPARATUS AND METHOD
摘要
申请公布号	GB9223130(D0)	申请公布日期	1992.12.16
申请号	GB19920023130	申请日期	1992.11.04
申请人	MITSUBISHI ELECTRIC CORP	发明人
分类号	G11C29/00;G11C29/26;G11C29/38	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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