SCATTERED X-RAY MEASURING APPARATUS,申请号JP19910138797-传众专利搜索

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发明名称	SCATTERED X-RAY MEASURING APPARATUS
摘要
申请公布号	JPH04364454(A)	申请公布日期	1992.12.16
申请号	JP19910138797	申请日期	1991.06.11
申请人	TOSHIBA CORP	发明人	MATSUSHITA HIROSHI
分类号	G01B15/00;G01N23/02	主分类号	G01B15/00
代理机构		代理人
主权项
地址

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