发明名称 SYNTHETIC TEST CIRCUIT FOR BREAKER
摘要 <p>PURPOSE:To apply AC recovery voltage to a breaker to be tested after breaking operation by providing a second voltage source circuit applying AC recovery voltage of the same phase as a current source circuit in rotation with a first voltage source circuit applying DC recovery voltage to the breaker to be tested after breaking operation. CONSTITUTION:When a charging switch 3 is closed from such a state that a protective breaker 2, an auxiliary breaker 6 and a breaker 7 to be tested are closed, a short circuit current I flows to the breaker 7 to be tested. When the breaker 7 to be tested succeeds in breaking, the current IV of high frequency of a voltage source circuit 18 is cut off and transient recovery voltage appears in the breaker 7 to be tested. Thereafter, the charged voltage of a transient recover voltage frequency adjusting condenser 10 is applied to the breaker 7 to be tested. Next, the breaker 14 for cutting off the voltage source circuit is opened to cut off the voltage source circuit 18. Immediately thereafter, a breaker 15 for closing a power supply circuit is closed to connect the high voltage tap of a current supply source voltage boosting transformer 16 to the breaker 7 to be tested. By this method, AC recovery voltage Er having a predetermined value is applied to the breaker 7 to be tested.</p>
申请公布号 JPH04363677(A) 申请公布日期 1992.12.16
申请号 JP19910231278 申请日期 1991.09.11
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAKAMURA HITOSHI
分类号 G01R31/327;G01R31/333 主分类号 G01R31/327
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