首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD OF TESTING DIELECTRIC BREAKDOWN STRENGTH OF SEMICONDUCTOR DEVICE
摘要
申请公布号
JPH04361549(A)
申请公布日期
1992.12.15
申请号
JP19910137450
申请日期
1991.06.10
申请人
MITSUBISHI ELECTRIC CORP
发明人
TAKAGI HISASHI
分类号
G01R31/26;H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Inflatable insulating mattress
Luminaire
Coupling device
Process for removing sulfur and nitrogen from a conversion feed stock with return ofnitrogen to conversion product
High-vacuum condenser tank for ion rocket tests
Process for removing mineral constituents from an aqueous liquid
Luminair
Means for stimulating the flow of fluids in animal bodies
Optical whitening agents of the stilbene triazole type
Insulated electrical conductor
Fermentative process of producing lactone of 2-oxo-6(2-hydroxypropyl)-cyclohexane carboxylic acid
Cement base paints, etc.
Preparation of refractory oxide crystals
Headrest cover
Process for the manufacture of dyestuffs
Apparatus for cleaning gases from ferrous metallurgical operations
Absorbent product
Mobile pelletizing apparatus
Sample introduction system for gas chromatography apparatus
Guide conduit for motion transmitting system
