发明名称 Semiconductor memory cell having high density structure
摘要 In a semiconductor memory cell of a DRAM comprising a stacked cell capacitor constructed upon word and bit lines, the stacked cell capacitor is not directly connected to a transistor to the device isolator area is provided. Through this wiring, the diffusion layer of the transistor is connected to the stacked cell capacitor. Also, a bit line is constructed on the active region to cross the connection point between the transistor, local wiring and gate electrode.
申请公布号 US5172202(A) 申请公布日期 1992.12.15
申请号 US19920859253 申请日期 1992.03.26
申请人 NEC CORPORATION 发明人 KAZUO, TERADA
分类号 H01L27/108 主分类号 H01L27/108
代理机构 代理人
主权项
地址