发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To exclude the etching of 3 semiconductor substrate, and reduce stress. CONSTITUTION:When a polysilicon layer which is formed on a semiconductor substrate 3 like DRAM and NVDRAM and has direct contact is formed, side walls 14 are formed in a two-layered structure of an SiN film 6 and an SiO2 film, and then the direct contact is formed in a self-alignment manner. Damage of the semiconductor substrate is avoided and junction leak can be prevented.
申请公布号 JPH04360525(A) 申请公布日期 1992.12.14
申请号 JP19910136798 申请日期 1991.06.07
申请人 SHARP CORP 发明人 TATSUOKA HIDEHISA;YUTSUGI TATSUYUKI;YAMAUCHI YOSHIMITSU
分类号 H01L21/28;H01L21/8242;H01L21/8247;H01L27/10;H01L27/108;H01L29/788;H01L29/792 主分类号 H01L21/28
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