| 摘要 |
PURPOSE:To easily execute trouble shooting such as the specification of a fault generating point or the cause investigation by obtaining fault analysis information stored in a main storage device according to a parameter corresponding to a fault. CONSTITUTION:When the fault is detected as the result of executing a test program, it is detected by a fault detection part 2. When the fault is detected, a fault analysis information corresponding part 3 presents the parameter for corresponding an area on the main storage device storing the information required for analyzing the fault. A fault analysis information collection part 4 collects the fault analysis information stored in the main storage device based on this parameter, and a fault analysis information display part 5 displays the fault analysis information on a display device. When the test program is completely executed, a test program end control part 6 ends the test program. Thus, when the fault is detected by a certain test program, the information required for analyzing the fault can be collected from the main storage device. |
