发明名称 METHOD OF MANUFACTURING SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPE USE
摘要 PURPOSE:To inspect a surface of a crystal and a treatment effect of the inside layer at a time, by cleaving a crystal so that a first cleavage plane crosses a secondary cleavage plane for preparing a wedge-shaped crystal, fixing the wedge-shaped crystal with a reinforcing ring, and providing a surface treatment thereon in a given solution or in a given vapor phase. CONSTITUTION:Crystalline estimation and component analysis are carried out by directing an electron beam 15 over the surface of a sample after a surface treatment is performed in a given solution or in a given vapor phase. In this case, the sample is cleaved so that a first cleavage plane 10 crosses a secondary cleavage plane 11 and a wedge-shaped crystal is prepared. Then, the wedge- shaped crystal is fixed with a reinforcing ring 12 in the specific position and then a surface treatment is carried out in a given solution or in a given vapor phase. In addition to this way, after the surface treatment is carried out in a given solution or in a vapor phase, the sample is cleaved so that a first cleavage plane 10 crosses a secondary cleavage plane 11 and a wedge-shaped crystal is prepared. Then, the crystallinity estimation and component analysis can be carried out by irradiating an electron beam 15.
申请公布号 JPH04359450(A) 申请公布日期 1992.12.11
申请号 JP19910133966 申请日期 1991.06.05
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TAKAHASHI YASUHITO;KAMIYAMA SATOSHI;YABUUCHI YASUFUMI
分类号 G01N23/207;G01N23/223;H01L21/66;H01L29/201 主分类号 G01N23/207
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