首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
TEST CIRCUIT FOR SEMICONDUCTOR DEVICE
摘要
申请公布号
JPH04355386(A)
申请公布日期
1992.12.09
申请号
JP19910157571
申请日期
1991.05.31
申请人
NEC CORP
发明人
AKIYAMA KAZUHIRO
分类号
G01R31/26;G01R31/28
主分类号
G01R31/26
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Nappy with heat-sealed disposal bag
Process
Control of setting means in an engine fuel supply system
Vaquatec spillmaster
Special apparatus to play a new game
Image processing apparatus
Improvements in or relating to modular buildings
Transaction processing
Dual mode radio subscriber unit having a diversity receiver apparatus and method therefor
A mobile aggregate material processing plant
Improvements in or relating to organic compositions
Topical composition for burn relief and method of use
Sheet receiver apparatus
JUNCTION BOX FOR LOW PROFILE RAISED PANEL FLOORING
RETRACTABLE CLOSURE SYSTEM
Fastener
Token bus protocol Number 3A
Plume abatement devices for water cooling towers
Tyres
Locking structure for a motor vehicle gear shift lever